A dual-function ESPI system for the measurement of out-of-plane displacement and slope
✍ Scribed by B. Bhaduri; N.K. Mohan; M.P. Kothiyal
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 580 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0143-8166
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✦ Synopsis
A dual-function ESPI system is developed for the measurement of out-of-plane displacement and its slope change. The proposed system is convenient and also efficient to switch over from an out-of-plane sensitive configuration to shearography. A difference-ofphase method with a five-step algorithm is used for speckle fringe analysis.
📜 SIMILAR VOLUMES
Out-of-plane conÿgurations used in electronic speckle pattern interferometry (ESPI), introduce phase error interpretation in extended target objects due to spatial variation of the sensitivity vector. In this paper, a general model to predict and correct the displacement measurement error and error