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A dual-function ESPI system for the measurement of out-of-plane displacement and slope

✍ Scribed by B. Bhaduri; N.K. Mohan; M.P. Kothiyal


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
580 KB
Volume
44
Category
Article
ISSN
0143-8166

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✦ Synopsis


A dual-function ESPI system is developed for the measurement of out-of-plane displacement and its slope change. The proposed system is convenient and also efficient to switch over from an out-of-plane sensitive configuration to shearography. A difference-ofphase method with a five-step algorithm is used for speckle fringe analysis.


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General model to predict and correct err
✍ H.J. Puga; R. Rodrı́guez-Vera; A. Martı́nez 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 736 KB

Out-of-plane conÿgurations used in electronic speckle pattern interferometry (ESPI), introduce phase error interpretation in extended target objects due to spatial variation of the sensitivity vector. In this paper, a general model to predict and correct the displacement measurement error and error