DSL photoetching and near infrared phase contrast microscopy on grown-in defects in Si doped LEC GaAs

✍ Scribed by J.L. Weyher; P.C. Montgomery

• Book ID: 107790373
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 507 KB
• Volume: 106
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/0022-0248(90)90094-2