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Drift-diffusion theory of symmetrical double-junction diodes

✍ Scribed by Pierre E. Schmidt; Heinz K. Henisch


Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
378 KB
Volume
25
Category
Article
ISSN
0038-1101

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This paper considers the adaptation of drift-diffusion device simulation methodology to study Auger-recombination-induced hot electron transport characteristics in InGaAsP/InP double heterostructure laser diodes. In order to model the transport behaviour of the Auger hot electrons, we decompose the