Bimodal statistic on a single dot device
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C. Fricke; F. Hohls; W. Wegscheider; R.J. Haug
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Article
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2008
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Elsevier Science
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English
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We explore the full counting statistics of single electron tunneling through a quantum dot using a quantum point contact as noninvasive high bandwidth charge detector. The distribution of counted tunneling events is measured as a function of gate and source-drain-voltage for several consecutive elec