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Dose-rate dependence of radiation-induced interface trap density in silicon bipolar transistors

โœ Scribed by H.P. Hjalmarson; R.L. Pease; C.E. Hembree; R.M. Van Ginhoven; P.A. Schultz


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
121 KB
Volume
250
Category
Article
ISSN
0168-583X

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