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Dopant and impurity effects in electrodeposited CdS/CdTe thin films for photovoltaic applications

✍ Scribed by Dennison, Stephen

Book ID
121288239
Publisher
Royal Society of Chemistry
Year
1994
Tongue
English
Weight
872 KB
Volume
4
Category
Article
ISSN
0959-9428

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## Abstract Real time spectroscopic ellipsometry (RTSE) has been applied to study the deposition of polycrystalline CdTe, CdS, and CdTe~1–__x__~ S__~x~__ thin films on crystalline silicon wafer substrates as well as the formation of CdS/CdTe and CdTe/CdS heterojunctions, all using a magnetron sputt