Unveiling the defect levels in SnS thin
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Sajeesh, T. H. ;Poornima, N. ;Kartha, C. Sudha ;Vijayakumar, K. P.
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Article
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2010
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John Wiley and Sons
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English
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## Abstract Exploiting the potential of the material for the photovoltaic applications requires an extensive defect level analysis, mandatory. Photoluminescence (PL) technique was employed to probe the defect levels in pโSnS thin films deposited using chemical spray pyrolysis (CSP) technique. Three