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Dominant role of grain boundary scattering in the resistivity of nanometric Cu films

✍ Scribed by Sun, Tik; Yao, Bo; Warren, Andrew P.; Barmak, Katayun; Toney, Michael F.; Peale, Robert E.; Coffey, Kevin R.

Book ID: 121457399
Publisher: The American Physical Society
Year: 2009
Tongue: English
Weight: 215 KB
Volume: 79
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.79.041402

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