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Do Grain Boundaries Affect Microwave Dielectric Loss in Oxides?

โœ Scribed by Jonathan D. Breeze; James M. Perkins; David W. McComb; Neil McN. Alford


Book ID
109262331
Publisher
John Wiley and Sons
Year
2009
Tongue
English
Weight
245 KB
Volume
92
Category
Article
ISSN
0002-7820

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