Improvements in Silicon Oxide Dielectric Loss for Superconducting Microwave Detector Circuits

✍ Scribed by Li, D.; Gao, J.; Austermann, J. E.; Beall, J. A.; Becker, D.; Cho, H.; Fox, A. E.; Halverson, N.; Henning, J.; Hilton, G. C.; Hubmayr, J.; Irwin, K. D.; Van Lanen, J.; Nibarger, J.; Niemack, M.

• Book ID: 121478310
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 793 KB
• Volume: 23
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/TASC.2013.2242951