Observation of interference fringes due
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Negishi, Riichirou ;Fukamachi, Tomoe ;Yoshizawa, Masami ;Hirano, Keiichi ;Kawamu
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Article
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2007
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John Wiley and Sons
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English
β 803 KB
## Abstract The interference fringe caused by lattice distortion around a defect is observed in the resonant scattering Xβray topography for the GaAs 200 reflection in the Laue case. The amplitude of the fringe can be maximized when the Fourier transform of the imaginary part of Xβray polarizabilit