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Dissipation by adhesion hysteresis in dynamic force microscopy

✍ Scribed by Sahagún, Enrique; Sáenz, Juan José

Book ID
120260347
Publisher
The American Physical Society
Year
2012
Tongue
English
Weight
344 KB
Volume
85
Category
Article
ISSN
1098-0121

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Dynamic force microscopy has proved to be a powerful imaging tool. Here, the tip of an atomic force microscope is vibrated at a high frequency, typically the resonance frequency of the lever sensor, and at a large vibration amplitude, typically of the order of 10 nm. Imaging contrast is obtained fro