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Simulation of fluctuation and dissipation in dynamic force microscopy

✍ Scribed by H. Nanjo; L. Nony; M. Yoneya; N. Sanada; T. Iijima; J.P. Aimé

Book ID
108417652
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
319 KB
Volume
188
Category
Article
ISSN
0169-4332

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Dynamic force microscopy has proved to be a powerful imaging tool. Here, the tip of an atomic force microscope is vibrated at a high frequency, typically the resonance frequency of the lever sensor, and at a large vibration amplitude, typically of the order of 10 nm. Imaging contrast is obtained fro