Displacement damage degradation of ion-induced charge in Si pin photodiode

✍ Scribed by Shinobu Onoda; Toshio Hirao; Jamie Stuart Laird; Hidenobu Mori; Hisayoshi Itoh; Takeshi Wakasa; Tsuyoshi Okamoto; Yoshiharu Koizumi

• Book ID: 114167122
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 103 KB
• Volume: 206
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(03)00790-0