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Dispersion Behaviors of Copper Oxide on the Mixed “CeO 2 + γ-Al 2 O 3 ” Support

✍ Scribed by Dong, L.; Hu, Y.; Shen, M.; Jin, T.; Wang, J.; Ding, W.; Chen, Y.

Book ID
121407267
Publisher
American Chemical Society
Year
2001
Tongue
English
Weight
91 KB
Volume
13
Category
Article
ISSN
0897-4756

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Laser Raman spectroscopy (LRS), X-ray di4raction (XRD), X-ray photoelectron spectroscopy (XPS), ultraviolet and di4use re6ectance spectroscopy (UV-DRS), and temperature-programmed reduction (TPR) are used to characterize a series of TiO 2 / -Al 2 O 3 , NiO/ -Al 2 O 3 , and NiO/TiO 2 / -Al 2 O 3 samp