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Dislocation locking by nitrogen impurities in FZ-silicon

✍ Scribed by A. Giannattasio; S. Senkader; R.J. Falster; P.R. Wilshaw

Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
190 KB
Volume
340-342
Category
Article
ISSN
0921-4526

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