Disconnect Switch Induced Transients and Trapped Charge-Insulated Substations

✍ Scribed by Boggs, S. A.; Chu, F. Y.; Fujimoto, N.; Krenicky, A.; Plessl, A.; Schlicht, D.

• Book ID: 117898112
• Publisher: IEEE
• Year: 1982
• Tongue: English
• Weight: 269 KB
• Volume: PER-2
• Category: Article
• ISSN: 0272-1724
• DOI: 10.1109/mper.1982.5519872