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Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents

✍ Scribed by Klaus-Willi Pieper; Martin Sauter

Book ID: 108361799
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 333 KB
Volume: 41
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(00)00221-3

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