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Direct Measurement of the Dielectric Constants of Silicon and Germanium

โœ Scribed by Dunlap, W. C.; Watters, R. L.


Book ID
118150787
Publisher
The American Physical Society
Year
1953
Tongue
English
Weight
158 KB
Volume
92
Category
Article
ISSN
0031-899X

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๐Ÿ“œ SIMILAR VOLUMES


THE MEASUREMENT OF DIELECTRIC CONSTANTS.
โœ King, J. F.; Patrick, W. A. ๐Ÿ“‚ Article ๐Ÿ“… 1921 ๐Ÿ› American Chemical Society ๐ŸŒ English โš– 583 KB
Low temperature measurements of the diel
โœ R.D. Biggar; K.R. Lane; J.M. Parpia ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 142 KB

We have measured the capacitance of a silicon wafer contained between two bulk metallic electrodes. The capacitance has a prominent, feature which is frequency and magnetic field dependent at. a temperature of about 5K for a 0.2f~-cm nominal resistance sample, and which is seen to be replicated at h