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Direct measurement of interface state electron capture cross-section in MOS system by DLTS technique

✍ Scribed by Gupta, D. S. ;Chandra, M. M. ;Kumar, V.

Publisher: John Wiley and Sons
Year: 1983
Tongue: English
Weight: 269 KB
Volume: 80
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210800258

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