A. Georgakilas 1 ) (a, b), M. Androulidaki (a), K. Tsagaraki (a), K. Amimer (a), G. Constantinidis (a), N.T. Pelekanos (c), M. Calamiotou (d), Zs. Czigany (e), and B. Pecz (e)
Direct MBE growth of GaN on GaAs substrates for integrated short wavelength emitters
β Scribed by A Georgakilas; K Tsagaraki; E Makarona; G Constantinidis; M Adroulidaki; M Kayambaki; E Aperathitis; N.T Pelekanos
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 404 KB
- Volume
- 3
- Category
- Article
- ISSN
- 1369-8001
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β¦ Synopsis
The growth and material properties of GaN heteroepitaxial layers on vicinal (1 0 0) and exact (1 1 1)B substrates have been investigated, using molecular beam epitaxy (MBE) with N 2 RF-plasma source. We examined the approach to grow GaN directly on the oxide desorbed GaAs, without the incidence of an As beam during oxide desorption or the following stages of growth. Perfect smooth surfaces were obtained on (1 1 1)B GaAs but excellent luminescence properties were observed on vicinal (1 0 0) GaAs. Four growth temperatures (T G ) were compared for the (1 0 0) orientation and a monotonic increase of photoluminescence intensity with increasing T G , in the range of 570-6808C, was observed. The best surface morphology of less than 10 nm rms roughness was also determined, by atomic force microscopy, for the maximum (6808C) temperature. The layers exhibited up to 10 17 cm Γ3 electron concentration and it could be compensated by Mg impurities. Metallizations of Pt and Pd gave ohmic contacts on GaN/GaAs (1 0 0) but a Schottky diode contact was achieved by Ir metallization. The obtained material properties are probably sufficient for realizing efficient GaN light emitters on (1 0 0) GaAs substrates.
π SIMILAR VOLUMES
## Abstract A novel windowed growth technique that allows for the exposure of a smooth silicon surface for MOS circuitry between AlGaN/GaN HEMT layers has been developed. A sacrificial oxide based dielectric stack is used to protect regions of the silicon surface before growth by ammoniaβMBE. SIMS
The n-GaAs layer was successfully grown on (1 0 0) p-type silicon (p-Si) substrate by molecular beam epitaxy (MBE) using rough surface buffer layer (RSi) to reduce the tensile stress in GaAs layer grown on Si substrate. We have reviewed the initial stage and the recombination of GaAs epitaxial layer