Direct identification of As vacancies in GaAs using positron annihilation calibrated by scanning tunneling microscopy

✍ Scribed by Gebauer, J.; Krause-Rehberg, R.; Domke, C.; Ebert, Ph.; Urban, K.; Staab, T. E. M.

• Book ID: 119971568
• Publisher: The American Physical Society
• Year: 2001
• Tongue: English
• Weight: 168 KB
• Volume: 63
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/PhysRevB.63.045203