Direct extraction of an empirical temperature-dependent InGaP/GaAs HBT large-signal model

✍ Scribed by Raghavan, A.; Venkataraman, S.; Banerjee, B.; Youngsuk Suh; Deukhyoun Heo; Laskar, J.

• Book ID: 119799192
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 594 KB
• Volume: 38
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/jssc.2003.815929