Direct determination of the thermal capture cross-section of majority carriers at deep centers in silicon using thermally stimulated capacitance

✍ Scribed by J. Barbolla; M. Pugnet; J.C. Brabant; M. Brousseau

• Publisher: Elsevier Science
• Year: 1977
• Tongue: French
• Weight: 237 KB
• Volume: 3
• Category: Article
• ISSN: 0304-3886
• DOI: 10.1016/0304-3886(77)90097-3