Direct correlation of generation lifetimes obtained from pulsed MOS capacitance and gated diode measurements

✍ Scribed by K.S. Rabbani; D.R. Lamb

• Book ID: 107856654
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 916 KB
• Volume: 26
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(83)90118-1