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Direct Analysis of Silicon Carbide Powder by Total Reflection X-ray Fluorescence Spectrometry

✍ Scribed by Csato, I.; Zaray, Gy.; Gal-Solymos, K.; Hassler, J.


Book ID
115363190
Publisher
Society for Applied Spectroscopy
Year
1997
Tongue
English
Weight
390 KB
Volume
51
Category
Article
ISSN
0003-7028

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Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental