Diminished electron cloud broadening in a silicon drift detector by sawtooth p+ strips

✍ Scribed by Sonsky, J.; Valk, H.; Allier, C.P.; Hollander, R.W.; van Eijk, C.W.E.; Sarro, P.M.

• Book ID: 114554908
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 511 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.747767