Compton Scattering Artifacts in Electron Excited X-Ray Spectra Measured with a Silicon Drift Detector

✍ Scribed by Ritchie, Nicholas W.M.; Newbury, Dale E.; Lindstrom, Abigail P.

• Book ID: 120976630
• Publisher: Cambridge University Press
• Year: 2011
• Tongue: English
• Weight: 363 KB
• Volume: 17
• Category: Article
• ISSN: 1431-9276
• DOI: 10.1017/S1431927611012189