Digital deep level transient spectroscopy considered for discrimination of traps closely spaced in emission coefficients in semiconductors

✍ Scribed by H. K. Kim; T. E. Schlesinger; A. G. Milnes

• Book ID: 112812288
• Publisher: Springer US
• Year: 1988
• Tongue: English
• Weight: 534 KB
• Volume: 17
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/bf02652150