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Diffusion of iron in Cr2O3: polycrystals and thin films

โœ Scribed by A.C.S. Sabioni; A.M. Huntz; F. Silva; F. Jomard


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
420 KB
Volume
392
Category
Article
ISSN
0921-5093

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Growth and characterization of Y2O3 thin
โœ Xuerui Cheng; Zeming Qi; Guobin Zhang; Hongjun Zhou; Weiping Zhang; Min Yin ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 266 KB

Y 2 O 3 thin films were grown on silicon (1 0 0) substrates by pulsed-laser deposition at different substrate temperatures and O 2 pressures. The structure and composition of films are studied by using X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS). The Y 2 O 3 thin films deposit