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Diffusion of gold and native defects in mercury cadmium telluride

✍ Scribed by Anthony J. Ciani; Serdar Ogut; Inder P. Batra; Siva Sivananthan


Book ID
107453338
Publisher
Springer US
Year
2005
Tongue
English
Weight
480 KB
Volume
34
Category
Article
ISSN
0361-5235

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## Abstract Secondary ion mass spectrometry (SIMS) requires the preparation and measurement of standard samples in order to be considered a quantitative technique. This normally can be achieved by the production of ion‐implanted specimens in the matrix to be studied. The measured SIMS depth profile