Diffusion length determination in thin f
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A. Bouazzi; J.J. Loferski; M. Kwietniak; R.R. Arya; M. Sosnowski
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Article
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1984
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Elsevier Science
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English
⚖ 256 KB
Minority carrier diffusion lengths in thin film p-CuInSe2 and n-CdS were determined from the decay of the short-circuit current generated by the electron beam of a scanning electron microscope (SEM) for different accelerating voltages. The bulk diffusion lengths were determined taking into account t