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Cover of diffraction methods in materials science
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diffraction methods in materials science


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๐Ÿ“œ SIMILAR VOLUMES


Electron Backscatter Diffraction in Mate
โœ Robert A. Schwarzer, David P. Field (auth.), Adam J. Schwartz, Mukul Kumar, Bren ๐Ÿ“‚ Library ๐Ÿ“… 2009 ๐Ÿ› Springer US ๐ŸŒ English

<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined

Electron Backscatter Diffraction in Mate
โœ Adam J. Schwartz,Mukul Kumar,Brent L. Adams ๐Ÿ“‚ Library ๐Ÿ“… 2000 ๐ŸŒ English

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or

Electron Backscatter Diffraction in Mate
โœ Robert A. Schwarzer, David P. Field (auth.), Adam J. Schwartz, Mukul Kumar, Bren ๐Ÿ“‚ Library ๐Ÿ“… 2009 ๐Ÿ› Springer US ๐ŸŒ English

<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined

Electron Backscatter Diffraction in Mate
โœ Robert A. Schwarzer, David P. Field (auth.), Adam J. Schwartz, Mukul Kumar, Bren ๐Ÿ“‚ Library ๐Ÿ“… 2009 ๐Ÿ› Springer US ๐ŸŒ English

<p><P>Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined

Electron backscatter diffraction in mate
โœ Adam J Schwartz; Mukul Kumar; B L Adams ๐Ÿ“‚ Library ๐Ÿ“… 2000 ๐Ÿ› Kluwer Academic ๐ŸŒ English

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or