The applicability of models based on fractal geometry to characterize thin-Ðlm surfaces was investigated. The fractal geometry of sputtered chromium nitride and silicon nitride thin-Ðlm surfaces was described using Fourier spectral analysis of proÐles from scanning tunnelling microscopy images and a
Differentiability and Dimension of Some Fractal Fourier Series
✍ Scribed by Fernando Chamizo; Antonio Córdoba
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 273 KB
- Volume
- 142
- Category
- Article
- ISSN
- 0001-8708
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