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Different methods for the determination of damage profiles in Si from RBS-channeling spectra: a comparison

✍ Scribed by E. Albertazzi; M. Bianconi; G. Lulli; R. Nipoti; M. Cantiano


Book ID
113287495
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
535 KB
Volume
118
Category
Article
ISSN
0168-583X

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