THE object of this paper is to discuss dielectric stresses from what may be called the mechanical as distinguished from the atomistic or electronic point of view. The discussion is based on two ideas, namely (a) That dielectric break-down occurs at a definite eiectric field intensity, and (b) That the line of dielectric break-down is a conducting path.
The present paper discusses dielectric stresses only insofar as they are modified by variations of,inductivity and shapes of metal parts; fatigue effects (and other effects involving time), the peculiar break-down characteristics of very short air gaps, the corona discharge, and so on will be discussed in a second paper which will be Based almost wholly upon the electron theory.
The ordinary practical units, ampere, ohm, volt, coulomb, farad, volt-eentimetre, volt per centimetre, etc. are used exclusively in this paper.
A familiarity with the condenser is taken for granted. The equation of the condenser is:
in which E is the electromotive force applied to the condenser plates, Q is the amount of charge drawn out of one plate and forced into the other plate, C is the capacity of the condenser.