Dielectric Properties of Tin Oxide Thin
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Dr. J. Siva Kumar; Dr. U. V. Subba Rao
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Article
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1991
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John Wiley and Sons
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English
β 260 KB
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Thin films of several thicknesses in the form of MIM structures are prepared from the powders of tin oxide (SnO,) by thermal evaporation technique in a vacuum of Torr. The dielectric properties of tin oxide film capacitors have been studied with temperatures varying from 77 to 400 K and also with fr