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Dielectric behaviour of Yb2O3 thin film capacitors

✍ Scribed by T. Wiktorczyk; C. Wesołowska

Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
445 KB
Volume
120
Category
Article
ISSN
0040-6090

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✍ Dr. J. Siva Kumar; Dr. U. V. Subba Rao 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 260 KB 👁 1 views

Thin films of several thicknesses in the form of MIM structures are prepared from the powders of tin oxide (SnO,) by thermal evaporation technique in a vacuum of Torr. The dielectric properties of tin oxide film capacitors have been studied with temperatures varying from 77 to 400 K and also with fr