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Dielectric properties of Mg-doped Ba0.96Ca0.04Ti0.84Zr0.16O3 thin films fabricated by metalorganic decomposition method

✍ Scribed by Yi, Woo-Chul; Kalkur, T. S.; Philofsky, Elliott; Kammerdiner, Lee; Rywak, Anthony A.

No coin nor oath required. For personal study only.

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