Dielectric polarization processes in Bi:SrTiO3
β Scribed by Ang Chen; Zhi Yu; J Scott; A Loidl; R Guo; A.S Bhalla; L.E Cross
- Publisher
- Elsevier Science
- Year
- 2000
- Tongue
- English
- Weight
- 215 KB
- Volume
- 61
- Category
- Article
- ISSN
- 0022-3697
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β¦ Synopsis
The dielectric anomalies occurring around 8, 18, 30, and 65 K (at 100 Hz) in Bi:SrTiO 3 have been observed. They are frequency-dispersive and their relaxation rate follows the Arrhenius law. The physical nature of the dielectric anomalies around 18 and 30 K has been the focus of the study, and a possible explanation is given.
π SIMILAR VOLUMES
## Abstract The frequency and temperature dependence of the dielectric constant of SrTiO~3~ (STO) thinβfilm capacitors in multilayer structures of YBa~2~Cu~3~O~7β__Ξ΄__~/SrTiO~3~/YBa~2~Cu~3~O~7β__Ξ΄__~ films were measured over the frequency range 100 to 10^6^ Hz at 2β300 K. In a 750βnmβthick STO film
In addition to the dielectric relaxation around 170 K in the cubic structure of Srl\_3x/2LaxTiO 3, a similar relaxation was observed at about 70 K in the tetragonal structure with an activation energy in the range 0.1 3-0.16 eV which increases as x in Srl\_3x/2La,TiO 3 varies from 0.60-3.00 at %. Th