Large dielectric constant arising from space-charge polarization in a SrTiO3thin film grown on an YBa2Cu3O7-δlayer
✍ Scribed by Prijamboedi, B. ;Takashima, H. ;Wang, R. ;Shoji, A. ;Itoh, M.
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 210 KB
- Volume
- 202
- Category
- Article
- ISSN
- 0031-8965
No coin nor oath required. For personal study only.
✦ Synopsis
Abstract
The frequency and temperature dependence of the dielectric constant of SrTiO~3~ (STO) thin‐film capacitors in multilayer structures of YBa~2~Cu~3~O~7–δ~/SrTiO~3~/YBa~2~Cu~3~O~7–δ~ films were measured over the frequency range 100 to 10^6^ Hz at 2–300 K. In a 750‐nm‐thick STO film, a low‐frequency dielectric dispersion gradually occurs in the temperature region below 50 K; at 5 K, the dielectric constant ε~r~ increases to 1.1 × 10^5^ at frequencies below 10^3^ Hz. A space‐charge polarization mechanism is responsible for the large observed dielectric constant of the STO thin films at low temperatures. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)