Dielectric constants by multifrequency non-contact atomic force microscopy
โ Scribed by Kumar, Bharat; Bonvallet, Joseph C; Crittenden, Scott R
- Book ID
- 120268965
- Publisher
- Institute of Physics
- Year
- 2011
- Tongue
- English
- Weight
- 348 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0957-4484
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๐ SIMILAR VOLUMES
Dielectric constant variation at aqueous solution/mica interfaces is shown to be responsible for the force acting on tips immersed in the double layer. The exchange of the volume of a region of the electric double layer of a mica surface immersed in aqueous solutions, with a dielectric constant, by
The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The distance between cantilever tip and sample surface in non-contact AFM is a ti