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Contact and non-contact mode imaging by atomic force microscopy

✍ Scribed by Seizo Morita; Satoru Fujisawa; Eigo Kishi; Masahiro Ohta; Hitoshi Ueyama; Yasuhiro Sugawara


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
611 KB
Volume
273
Category
Article
ISSN
0040-6090

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