Contact and non-contact mode imaging by atomic force microscopy
β Scribed by Seizo Morita; Satoru Fujisawa; Eigo Kishi; Masahiro Ohta; Hitoshi Ueyama; Yasuhiro Sugawara
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 611 KB
- Volume
- 273
- Category
- Article
- ISSN
- 0040-6090
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The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications. The distance between cantilever tip and sample surface in non-contact AFM is a ti
Initially, calcite surfaces were imaged with regular tapping mode atomic force microscopy (AFM) at nearly true atomic resolution with a soft cantilever (k = 0.2 N m-1) resonantly oscillating in a liquid. Now, at least the same imaging quality in water could be achieved by driving a rather sti β (k =