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Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

✍ Scribed by Mehrdad Atabak; Özhan Ünverdi; H. Özgür Özer; Ahmet Oral


Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
710 KB
Volume
256
Category
Article
ISSN
0169-4332

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