## dICRO~¢ A novel tip configuration for atomic force microscopy (AFM) called tip-on-tip is presented. In this concept a sharp, very small tip is created on top of a large truncated pyramid. The process scheme for the fabrication of tip-on-tip is presented. It is demonstrated that very sharp metal
✦ LIBER ✦
Diamond tips and cantilevers for the characterization of semiconductor devices
✍ Scribed by Malavé, A; Oesterschulze, E; Kulisch, W; Trenkler, T; Hantschel, T; Vandervorst, W
- Book ID
- 122804902
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 272 KB
- Volume
- 8
- Category
- Article
- ISSN
- 0925-9635
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