๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Diameter measurements of polystyrene particles with atomic force microscopy

โœ Scribed by Garnaes, J

Book ID
118745403
Publisher
Institute of Physics
Year
2011
Tongue
English
Weight
882 KB
Volume
22
Category
Article
ISSN
0957-0233

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Atomic force and scanning electron micro
Atomic force and scanning electron microscopy of atmospheric particles
โœ Zahava Barkay; Amit Teller; Eliezer Ganor; Zev Levin; Yoram Shapira ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 864 KB

## Abstract Atomic force microscopy (AFM) and scanning electron microscopy with energy dispersive spectroscopy (SEMโ€“EDS) have been used for both morphological and elemental mass analysis study of atmospheric particles. As part of the geometrical particle analysis, and in addition to the traditional