The imaging of ultrafine Au, Pd, CdS, and ZnS particles prepared in reverse micelles has been studied by atomic force microscopy (AFM). Mica substrates, derivatized with a monolayer of amine or thiol-terminated silanes, were used to immobilize the particles. The substrates were exposed to reverse mi
Atomic force microscopy of ultrafine clay particles
β Scribed by J. Garnaes; H. Lindgreen; P.L. Hansen; S.A.C. Gould; P.K. Hansma
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 696 KB
- Volume
- 42-44
- Category
- Article
- ISSN
- 0304-3991
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