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Atomic Force Microscopy Study of Ultrafine Particles Prepared in Reverse Micelles

✍ Scribed by Hiroshi Sato; Takeshi Ohtsu; Isao Komasawa

Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 183 KB
Volume: 230
Category: Article
ISSN: 0021-9797
DOI: 10.1006/jcis.2000.7092

No coin nor oath required. For personal study only.

✦ Synopsis

The imaging of ultrafine Au, Pd, CdS, and ZnS particles prepared in reverse micelles has been studied by atomic force microscopy (AFM). Mica substrates, derivatized with a monolayer of amine or thiol-terminated silanes, were used to immobilize the particles. The substrates were exposed to reverse micellar solutions containing the particles and were then immersed in appropriate solvent media to remove surfactants. This resulted in a partial coating of the surfaces by the particles. The particle size was estimated as the height of protrusion, shown on the AFM images. The size values for the Pd and CdS particles, thus obtained, were found to be almost identical to those obtained by transmission electron microscopy (TEM), whereas those for the Au and ZnS particles were larger than those obtained by TEM. Scanning electron microscopy showed that the Au particles tended to aggregate on the surfaces, while Pd particles were isolated from one another.

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