✦ LIBER ✦

Diagnostics of high-resistivity GaAs wafers by microwave photoconductivity

✍ Scribed by L. S. Vlasenko; A. T. Gorelenok; V. V. Emtsev; A. V. Kamanin; S. I. Kokhanovskii; D. S. Poloskin; N. M. Shmidt

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterization of silicon wafers by tr

✍ A. Sanders; M. Kunst 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 779 KB

Compensation mechanisms and the response

✍ Islam, N.E.; Schamiloglu, E.; Schoenberg, J.S.H.; Joshi, R.P. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 115 KB

High-resistivity LPE layers of GaAs by i

✍ Kojima, K. ;Hasegawa, H. 📂 Article 📅 1980 🏛 John Wiley and Sons 🌐 English ⚖ 441 KB

High resistivity layers of GaAs grown by

✍ A. Schlachetzki; H. Salow 📂 Article 📅 1975 🏛 Springer 🌐 English ⚖ 572 KB

Characterization of a semi-insulating Ga

✍ Islam, N. E.; Schamiloglu, E.; Fleddermann, C. B. 📂 Article 📅 1998 🏛 American Institute of Physics 🌐 English ⚖ 268 KB

Non-destructive characterization of elec

✍ Hideki Hasegawa; Hideo Ohno; Haruhito Shimizu; Shouhei Seki 📂 Article 📅 1984 🏛 Springer US 🌐 English ⚖ 631 KB