β Scribed by A. De Vos; P. De Visschere
No coin nor oath required. For personal study only.
It is well known that a moderate sheet resistance of the emitter layer of a solar cell can be modelled as a lumped series resistance. It has no influence on the open-circuit voltage and little influence on the short-circuit current. The lumped series resistance model enables the fill factor loss to be calculated. In the present paper it is shown that a large sheet resistance leads to current-voltage (I-V) characteristics which are not of the lumped series resistance type but which instead display the presence of a lumped "lightdependent shunt resistance". This qualitative diagnosis of an important distributed series resistance is completed using two quantitative diagnostic methods: the determination of the fill factor of the cell, and the measurement of the intersection of the V axis with the tangent to the I-V characteristic at the short-circuit point. The latter quantity, which we call the "shortcircuit voltage", turns out to be equal to about twice the open-circuit voltage, whereas the fill factor is in the range 30% -38%.
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